Concise answer
All interference problems reduce to counting path difference in wavelengths: gives double-slit and grating maxima, gives single-slit minima, and thin films add the wavelength-in-film and reflection phase shifts to the same bookkeeping.
Definitions
- Path difference
- The difference in distance traveled by two interfering waves; measured in wavelengths, it decides constructive versus destructive interference.
- Constructive interference
- Superposition in phase — path difference a whole number of wavelengths (plus any reflection shifts) — giving maximum intensity.
- Destructive interference
- Superposition out of phase — path difference an odd number of half-wavelengths — giving minimum intensity.
- Diffraction grating
- Many equally spaced slits; spacing $d$ is the inverse of the line density, and the many slits make the maxima sharp and bright.
- Reflection phase shift
- The half-wavelength ($\pi$) phase change a wave acquires when reflecting off a medium of higher refractive index; reflection off a lower index gives no shift.
Intuition
Every setup is the same question: by how many wavelengths do the two paths differ? Whole wavelengths reinforce; half-integer offsets cancel. Geometry (slits, films, gratings) only changes how the path difference is computed.
The double-slit condition marks maxima, but the single-slit condition marks minima. The reason: a single slit is a continuum of sources, and at the slit splits into halves that cancel pairwise — the same algebra, opposite meaning.
Concept walkthrough
Two slits separated by produce bright fringes where for . For a distant screen and small angles the fringes are equally spaced with . A grating obeys the same maxima condition with the line spacing (the inverse of lines per meter); with many slits the maxima sharpen into bright, narrow lines, which is what makes gratings good spectrometers.
A single slit of width produces dark fringes where for (no minimum — that is the central maximum, twice the width of the side lobes). In a real double-slit experiment the single-slit envelope modulates the double-slit fringes: separation sets the fine fringe spacing, width sets the envelope.
Thin films add two wrinkles to the path-difference bookkeeping. First, inside a film of index the wavelength is , so the extra path is counted in film wavelengths: the interference is governed by . Second, each reflection off a higher-index medium adds a half-wavelength shift. With exactly one such shift (a soap film in air, an anti-reflective coating between air and higher-index glass), constructive reflection requires ; with zero or two shifts the roles of the conditions swap.
After this page, you should be able to
- Locate double-slit and grating maxima with $d\sin\theta = m\lambda$ and convert to screen positions in the small-angle limit.
- Locate single-slit minima with $a\sin\theta = m\lambda$ and explain why the central maximum is twice as wide as the others.
- Account for the wavelength inside a film ($\lambda/n$) and reflection phase shifts in thin-film problems.
- Distinguish the roles of slit separation, slit width, and slit count in a fringe pattern.
Formulas and assumptions
Double-slit maxima
Variables
- d: slit separation in meters
- theta: angle from the central axis
- m: order of the bright fringe
- lambda: wavelength in meters
Assumptions
- The screen is far compared with the slit separation.
- The same condition with half-integer m locates the dark fringes.
Fringe spacing (small angles)
Variables
- Delta y: distance between adjacent bright fringes in meters
- L: slit-to-screen distance in meters
- d: slit separation in meters
- lambda: wavelength in meters
Assumptions
- Small angles: sin(theta) is approximately tan(theta).
- Fringes are equally spaced only in this limit.
Diffraction grating maxima
Variables
- d: spacing between adjacent grating lines in meters
- N: line density in lines per meter
- m: diffraction order
- lambda: wavelength in meters
Assumptions
- Same maxima condition as the double slit; many slits make the maxima far sharper.
- Orders exist only while |m| lambda / d is at most 1.
Single-slit minima
Variables
- a: slit width in meters
- theta: angle from the central axis
- m: order of the dark fringe
- lambda: wavelength in meters
Assumptions
- This condition locates minima, not maxima.
- m = 0 is excluded; the center of the pattern is the brightest point.
Thin-film constructive reflection (one phase shift)
Variables
- n: refractive index of the film
- t: film thickness in meters
- lambda: vacuum wavelength in meters
- m: order 0, 1, 2, ...
Assumptions
- Near-normal incidence.
- Exactly one of the two reflections has a half-wavelength phase shift (e.g. a soap film in air); with zero or two shifts, this condition gives destructive reflection instead.
Worked example
Fringe spacing in a double-slit experiment
Light of wavelength passes through two slits separated by , and fringes form on a screen away. Find the fringe spacing and the distance of the third-order bright fringe from the center.
- 1Check the small-angle limit: , tiny, so is safe.
- 2Fringe spacing: .
- 3So adjacent bright fringes are apart.
- 4Third-order fringe: from the central maximum.
The fringe spacing is , and the bright fringe sits from the center of the pattern.
Common traps
- Using to find single-slit maxima; for a single slit that condition locates the dark fringes.
- Confusing slit separation with slit width ; sets the fine fringe spacing while sets the diffraction envelope.
- Forgetting the wavelength shortens to inside a film, so the film condition uses , not .
- Dropping a reflection phase shift: each reflection off a higher-index medium adds half a wavelength, and only the net number of shifts matters.
- Expecting arbitrarily high grating orders; once exceeds 1 the order simply does not exist.
Related pages and practice
Question depth and domain coverage vary by exam. Practice answers are checked after submission.
Sources
- GRE Subject Test Content and Structure — ETS. Accessed 2026-07-06. Use as a cited source for exam facts; do not imply affiliation or reproduce protected test material.
- University Physics Volume 3, Section 3.1: Young's Double-Slit Interference — OpenStax. Accessed 2026-08-02. OpenStax textbook content is CC BY-NC-SA 4.0; attribute and avoid verbatim reuse beyond short cited references.
- University Physics Volume 3, Section 3.4: Interference in Thin Films — OpenStax. Accessed 2026-08-02. OpenStax textbook content is CC BY-NC-SA 4.0; attribute and avoid verbatim reuse beyond short cited references.
- University Physics Volume 3, Section 4.1: Single-Slit Diffraction — OpenStax. Accessed 2026-08-02. OpenStax textbook content is CC BY-NC-SA 4.0; attribute and avoid verbatim reuse beyond short cited references.
- University Physics Volume 3, Section 4.4: Diffraction Gratings — OpenStax. Accessed 2026-08-02. OpenStax textbook content is CC BY-NC-SA 4.0; attribute and avoid verbatim reuse beyond short cited references.
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